公开(公告)号：US09869631B2

公开(公告)日：2018-01-16

申请号：US14563318

申请日：2014-12-08

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jeong-min Jo ,  Tae-soo Kim ,  Sung-hwa Lee ,  Hyun-soo Jang

IPC: G01N21/59 ,  G01N21/13

CPC classification number: G01N21/13 ,  G01N2201/0256

Abstract: Disclosed are an analysis device and a method of determining a mounted state of a cartridge mounted in the analysis device. The analysis device includes: a mounting unit configured to mount a cartridge on which at least one well for containing a specimen is formed; a measuring unit configured to measure at least one signal corresponding to the at least one well formed on the cartridge; and an operation processor configured to process the at least one measured signal with respect to the at least one well measured by the measuring unit, wherein the operation processor determines a mounted state of the cartridge based on the at least one measured signal with respect to the at least one well formed on the cartridge.

公开(公告)号：US10113964B2

公开(公告)日：2018-10-30

申请号：US14513386

申请日：2014-10-14

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yeong-bae Yeo ,  Hyun-soo Jang

IPC: G01N21/59 ,  G01N21/75

Abstract: An optical detection apparatus for measuring detection chambers of a specimen cartridge includes: a light source unit including light sources which are arranged along a scan line on which the detection chambers are aligned to be scanned, and configured to emit light rays to the detection chambers; and an optical detector configured to detect the light rays having passed through corresponding detection chambers disposed on the scan line. The light sources include main wavelength light sources which are used for measuring samples disposed in the detection chambers, and a sub-wavelength light source which is used for correcting a measuring error.