公开(公告)号：US20150120637A1

公开(公告)日：2015-04-30

申请号：US14488147

申请日：2014-09-16

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： HYEON-SANG EOM ,  IN-SOON JO ,  MIN-YOUNG SUNG ,  MYUNG-JUNE JUNG ,  JU-PYUNG LEE

IPC: G06F9/52 ,  G06N5/02

CPC classification number: G06N5/025

Abstract: An apparatus and method for analyzing bottlenecks in a data distributed processing system. The apparatus includes a learning unit mining and learning bottleneck-feature association rules based on hardware information related to a bottleneck node, job configuration information related to a bottleneck causing job, and/or I/O information regarding a bottleneck causing task. Based on the bottleneck-feature association rules, a bottleneck cause analyzing unit detects a bottleneck node among multiple nodes performing tasks in the data distributed processing system, and analyzes the bottleneck cause.

Abstract translation: 一种用于分析数据分布式处理系统中的瓶颈的装置和方法。 该装置包括基于与瓶颈节点相关的硬件信息，与造成瓶颈的作业相关的作业配置信息和/或关于导致瓶颈的任务的I / O信息的学习单元挖掘和学习瓶颈特征关联规则。 基于瓶颈特征关联规则，瓶颈原因分析单元检测在数据分布式处理系统中执行任务的多个节点之间的瓶颈节点，并分析瓶颈原因。