公开(公告)号：US11568245B2

公开(公告)日：2023-01-31

申请号：US16760181

申请日：2017-12-15

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Tae Kwon Chang ,  In Kwon Choi ,  Jae Hyun Park

IPC: G10L15/00 ,  G06N3/08 ,  G06F40/30 ,  G06N3/04

Abstract: The present invention provides artificial intelligence technology which has machine-learning-based information understanding capability, including metric learning providing improved classification performance, classification of an object considering a semantic relationship, understanding of the meaning of a scene based on the metric learning and the classification, and the like. An electronic device according to one embodiment of the present invention comprises a memory in which at least one instruction is stored, and a processor for executing the stored instruction. Here, the processor extracts feature data from training data of a first class, obtains a feature point by mapping the extracted feature data to an embedding space, and makes an artificial neural network learn in a direction for reducing a distance between the obtained feature point and an anchor point.