公开(公告)号：US20250123327A1

公开(公告)日：2025-04-17

申请号：US18823768

申请日：2024-09-04

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hyungdong ROH ,  Jihun CHOI ,  Jaedo KIM ,  Jeongjin ROH ,  Youngjae CHO ,  Michael CHOI

IPC: G01R31/317

Abstract: A jitter measurement circuit for measuring a jitter of an input signal, the jitter measurement circuit including: a multiplexer configured to output a first comparison signal or a second comparison signal in response to an output signal; a detecting circuit configured to output a detection signal corresponding to a phase difference between an output of the multiplexer and the input signal; a first adder configured to sum the detection signal and a feedback signal; an integrating circuit configured to integrate and output an output of the first adder; a feedback circuit configured to trim an output of the integrating circuit to generate the feedback signal; and a comparator configured to generate an output signal by comparing the output of the integrating circuit with a reference potential.