公开(公告)号：US20240143039A1

公开(公告)日：2024-05-02

申请号：US18400288

申请日：2023-12-29

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Giwon SEOL ,  Jaeseon KIM ,  Jinho LEE ,  Jeongyeon JEON ,  Byounghee CHOI ,  Yongwook HWAN ,  Junghyeon HWANG

IPC: G06F1/16

CPC classification number: G06F1/1658 ,  G06F1/1635

Abstract: A plate of a housing includes a plate layer including an inner surface defining a groove which extends in an extension direction, a cut surface directly extending from the groove, a first surface roughness of the cut surface, and a second surface roughness of the inner surface which is different from the first surface roughness. The plate layer is a remaining thickness of a preliminary plate cut to remove a thickness portion thereof, the groove is a portion of a recessed pattern of the preliminary plate which is defined by the thickness portion and the remaining thickness facing each other, and the cut surface which has the first surface roughness is an exposed surface of the remaining thickness of the preliminary plate cut along a direction intersecting the extension direction of the groove to remove the thickness portion of the preliminary plate.

公开(公告)号：US20210190684A1

公开(公告)日：2021-06-24

申请号：US17251037

申请日：2019-05-29

Applicant: SAMSUNG ELECTRONICS CO., LTD. ,  3D INDUSTRIAL IMAGING CO., LTD.

Inventor： Jaeseon KIM ,  Kyunyeon KIM ,  Hyungbum KIM ,  Jongsu LEE ,  Youngjin YI ,  Donghyeon HWANG

IPC: G01N21/57 ,  G01N21/27

Abstract: Various embodiments of the present invention relate to an apparatus and method for measuring the surface of an electronic device, the apparatus comprising: a seating portion on which the electronic device is seated; a first light source for irradiating first light on the surface of the electronic device; a first camera for photographing the surface using the first light; a second light source for irradiating second light on the surface of the electronic device; a second camera for photographing the surface using the second light; and an analyzer electronically connected to the first light source, the first camera, the second light source, and the second camera, wherein the analyzer is setup to analyze the color of the surface acquired using the first light source and the first camera; and the gloss of the surface acquired using the second light source and the second camera, so as to analyze the color and gloss of the surface of the electronic device using quantified and digitized data, thereby enabling quality inspection of the surface of the electronic device without deviation. Various other embodiments are possible.