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公开(公告)号：US20210133064A1
公开(公告)日：2021-05-06
申请号：US16929419
申请日：2020-07-15
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Jongseon SHIN , Kihong KIM
Abstract: An integrated circuit chip includes a plurality of function blocks; a mode controller configured to convert an input signal, received from an external device through an input/output pin, into an input pattern and test mode setting data which include a plurality of bits, and to output the test mode setting data and a mode switching enable signal when a secure pattern generated therein is the same as the input pattern; and a mode setting module configured to control the plurality of function blocks to operate in a test mode according to the mode setting data, in response to the test mode switching enable signal.
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