公开(公告)号：US12019485B2

公开(公告)日：2024-06-25

申请号：US17661703

申请日：2022-05-02

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yun Chang ,  Sanggeun Yoo ,  Kwangkyu Bang ,  Kiljoong Yun ,  Songrye Choi ,  Jaegyu Choi

IPC: G06F1/18

CPC classification number: G06F1/187

Abstract: A storage device testing module includes a plate and a test board disposed on the plate and including a storage device receiver, the storage device receiver receiving a storage device to be tested. The storage device testing module further includes a sensor including a plurality of switches disposed on an inner surface of the storage device receiver, the plurality of switches being activated by movement of the storage device into the storage device receiver. The storage device testing module further includes a plurality of plungers disposed on the inner surface, contacting and supporting the storage device.