公开(公告)号：US20210302310A1

公开(公告)日：2021-09-30

申请号：US17187141

申请日：2021-02-26

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sreejith KALLUMMIL ,  Sujit JOS ,  Ibrahim A. ,  Ka Ram CHOI ,  Sang Kyu KIM

IPC: G01N21/47 ,  A61B5/145 ,  G06N20/00 ,  G06T7/00

Abstract: A method of transforming Monte Carlo (MC) simulations for diffuse reflectance spectroscopy (DRS) may include obtaining, by a DRS device, MC simulated DRS measurements using a pre-defined number of photons; pre-processing, by the DRS device, the MC simulated DRS measurements to obtain normalized DRS measurements; correcting, by the DRS device, non-monotonicity of the normalized DRS measurements to obtain monotonic DRS measurements; converting, by the DRS device, the monotonic DRS measurements to a logarithmic domain to obtain logarithmic DRS measurements; performing, by the DRS device, curve fitting on the logarithmic DRS measurements in the logarithmic domain to obtain curve-fitted logarithmic DRS measurements; and transforming, by the DRS device, the curve-fitted logarithmic DRS measurements to a non-logarithmic domain to obtain transformed MC simulated DRS measurements.