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公开(公告)号:US20210302310A1
公开(公告)日:2021-09-30
申请号:US17187141
申请日:2021-02-26
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sreejith KALLUMMIL , Sujit JOS , Ibrahim A. , Ka Ram CHOI , Sang Kyu KIM
Abstract: A method of transforming Monte Carlo (MC) simulations for diffuse reflectance spectroscopy (DRS) may include obtaining, by a DRS device, MC simulated DRS measurements using a pre-defined number of photons; pre-processing, by the DRS device, the MC simulated DRS measurements to obtain normalized DRS measurements; correcting, by the DRS device, non-monotonicity of the normalized DRS measurements to obtain monotonic DRS measurements; converting, by the DRS device, the monotonic DRS measurements to a logarithmic domain to obtain logarithmic DRS measurements; performing, by the DRS device, curve fitting on the logarithmic DRS measurements in the logarithmic domain to obtain curve-fitted logarithmic DRS measurements; and transforming, by the DRS device, the curve-fitted logarithmic DRS measurements to a non-logarithmic domain to obtain transformed MC simulated DRS measurements.