公开(公告)号：US11425324B2

公开(公告)日：2022-08-23

申请号：US16908722

申请日：2020-06-22

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Taeer Weiss ,  Roy Yam ,  Gal Bitan

IPC: H04N5/369 ,  H04N5/222 ,  H04N5/357 ,  G01S17/894

Abstract: A method for time-of-flight (ToF) guided down-up sampling includes calculating a guide function from a full resolution output of a ToF sensor, downsampling the full resolution output by a predetermined scaling factor, calculating a downsampled depth data from the downsampled output and upsampling the downsampled depth data to full resolution using the full resolution guide function.