公开(公告)号：US20180196949A1

公开(公告)日：2018-07-12

申请号：US15784548

申请日：2017-10-16

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Keun Young PARK ,  Ji Hyun KIM ,  Dong Jin PARK ,  Yoon Jick LEE

IPC: G06F21/60 ,  H04L9/08 ,  H04L9/14 ,  H04L9/30 ,  G06F9/44 ,  G06F11/07

Abstract: Provided is a method of operating a semiconductor device. A method of operating a semiconductor device includes storing secure data in a secure area of a memory in response to detecting a system failure; encrypting the secure data stored in the secure area by using a random key to generate encrypted secure data; storing the encrypted secure data in the secure area; and dumping the secure area and a non-secure area of the memory.