公开(公告)号：US20130082717A1

公开(公告)日：2013-04-04

申请号：US13644793

申请日：2012-10-04

Applicant: SAMSUNG ELECTRONICS CO. LTD.

Inventor： Jungmin KIM ,  Keonyoung SEO ,  Kwangmo YANG ,  Byeonghwan KANG ,  Bonghee PARK

IPC: G01R31/02

CPC classification number: G01R31/001 ,  G01R29/0871 ,  G01R31/002 ,  H04M1/24

Abstract: A method and an apparatus for measuring performance of an electronic device are provided. The apparatus includes an electromagnetic wave measuring device for measuring an actual level of an electromagnetic wave of an electronic device, and an analysis controller for applying a previously stored level change value to the actual level of the electromagnetic wave to compute a measured level of the electromagnetic wave. The method and the apparatus for measuring performance of an electronic device can easily measure an electromagnetic wave level of the electronic device without using a device suggested by an international standard.

Abstract translation: 提供了一种用于测量电子设备性能的方法和装置。 该装置包括用于测量电子设备的电磁波的实际电平的电磁波测量装置和用于将预先存储的电平变化值应用于电磁波的实际电平的分析控制器，以计算电磁波的测量电平 波。 用于测量电子设备性能的方法和装置可以容易地测量电子设备的电磁波水平，而不使用国际标准建议的设备。