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公开(公告)号：US20220300752A1
公开(公告)日：2022-09-22
申请号：US17203101
申请日：2021-03-16
Applicant: SAP SE
Inventor： Pritam Roy , Avinash Permude , Nithya Rajagopalan
Abstract: Methods, systems, and articles of manufacture, including computer program products, are provided for auto-detection of favorable outliers and unfavorable outliers using unsupervised clustering.
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