公开(公告)号：US20100194421A1

公开(公告)日：2010-08-05

申请号：US12365900

申请日：2009-02-05

申请人： SATOSHI IWAMOTO ,  SHIGEKI TAKIZAWA ,  KOICHI YATSUKA ,  TOSHIO MATSUURA

发明人： SATOSHI IWAMOTO ,  SHIGEKI TAKIZAWA ,  KOICHI YATSUKA ,  TOSHIO MATSUURA

IPC分类号： G01R31/02 ,  G06F1/12

CPC分类号： G01R31/31919 ,  G01R31/31922

摘要： Provided is a test apparatus that tests a device under test, comprising a pattern generating section that generates a test pattern for testing the device under test; a signal supplying section that supplies the device under test with a test signal corresponding to the test pattern; a trigger generating section that supplies a trigger signal to an external instrument connected to the device under test; and a synchronization control section that outputs, to the trigger generating section, a synchronization signal instructing generation of the trigger signal, based on at least a portion of the test pattern generated by the pattern generating section.

摘要翻译： 提供了一种测试被测设备的测试装置，包括产生用于测试被测设备的测试图案的模式产生部分; 信号提供部分，向所述被测器件供给与测试图案对应的测试信号; 触发生成部，其将触发信号提供给与被测设备连接的外部仪器; 以及同步控制部，其基于由所述图案生成部生成的所述测试图案的至少一部分，向所述触发生成部输出指示所述触发信号的生成的同步信号。

公开(公告)号：US20080133165A1

公开(公告)日：2008-06-05

申请号：US11763417

申请日：2007-06-14

申请人： SATOSHI IWAMOTO ,  ATSUNORI SHIBUYA ,  KOICHI YATSUKA

发明人： SATOSHI IWAMOTO ,  ATSUNORI SHIBUYA ,  KOICHI YATSUKA

IPC分类号： G06F19/00 ,  G01R31/00

CPC分类号： G01R31/31908

摘要： The test apparatus includes: a plurality of test modules that transmit/receive signals to/from the plurality of DUTs; a test head on which the plurality of test modules are placed; a plurality of device interface sections each of which is disposed between the test head and the plurality of test modules, includes a wiring that connects between a connector of the test head connected to the corresponding device under test and the test module and an identification information output section that outputs identification information indicative of the type of the device interface section, and is being capable of exchanging in accordance with the corresponding DUT and test module; and a control device connected to the plurality of test modules that controls the test module. Each test module includes: a reading section that reads the identification information; and a command processing section that returns the identification information to the control device.

摘要翻译： 测试装置包括：多个测试模块，用于向/从多个DUT发送/接收信号; 测试头，多个测试模块放置在该测试头上; 多个设备接口部分，每个设置在测试头和多个测试模块之间，包括连接在与被测设备相连的测试头的连接器与测试模块之间的接线以及识别信息输出 输出表示设备接口部分的类型的识别信息，并且能够根据相应的DUT和测试模块进行交换; 以及连接到控制测试模块的多个测试模块的控制设备。 每个测试模块包括：读取部分，读取识别信息; 以及命令处理部，其将所述识别信息返回给所述控制装置。