公开(公告)号：US20170245837A1

公开(公告)日：2017-08-31

申请号：US15519531

申请日：2015-12-31

Applicant: SHENZHEN INSTITUTES OF ADVANCED TECHNOLOGY, CHINESE ACADEMY OF SCIENCES

Inventor： Tiexiang WEN ,  Jia GU ,  Yaoqin XIE ,  Lei WANG

IPC: A61B8/00

CPC classification number: A61B8/587 ,  A61B8/4254 ,  A61B8/4444

Abstract: An ultrasound probe calibration system and method. The system comprises an ultrasound probe calibration phantom (100), and the ultrasound probe calibration phantom (100) is provided with a sunken recess (110) at a middle position of an upper surface thereof and with several conical holes on a side surface thereof. The sunken recess (110) is fixedly connected with a two dimensional ultrasound probe (220) therein. The conical hole is inserted with an NDI insertion stylus (230), and a tip of the NDI insertion stylus (230) can be acquired in ultrasound imaging. An ultrasound probe calibration system employing the above structure enables a midplane of an ultrasound plane to pass a midplane of an ultrasound probe calibration phantom (100) along a middle gap, such that a tip of an NDI insertion stylus (230) is used for the midplane of the ultrasound plane, thereby addressing the problem of misalignment of a point-type phantom or a two-dimensional plane-type phantom to the ultrasound plane.