FLOW RACK UNIT AND CONTROL SYSTEM FOR A FLOW RACK UNIT

    公开(公告)号:US20200164500A1

    公开(公告)日:2020-05-28

    申请号:US16691009

    申请日:2019-11-21

    申请人: SICK AG

    IPC分类号: B25H3/04 B65G1/137 G06Q10/08

    摘要: A flow rack unit for providing stock material units includes at least two rack bays and one control system. Each rack bay has a removal side and a storage side opposite the removal side and is configured to provide the stock material units in a respective bay level arranged next to one another starting in the direction of the storage side. A respective sensor arrangement of the control system is associated with each rack bay. Each sensor arrangement is arranged at the storage side of the associated rack bay and connected to a control unit of the control system via a common data line. The sensor arrangements each include an occupancy sensor configured as a distance sensor. Each occupancy sensor has a measurement zone that is aligned to measure a distance from a rearmost stock material unit stored in the associated rack bay and disposed closest to the occupancy sensor.

    METHOD OF MANUFACTURING AN OPTICAL SYSTEM
    2.
    发明申请

    公开(公告)号:US20200158919A1

    公开(公告)日:2020-05-21

    申请号:US16679817

    申请日:2019-11-11

    申请人: SICK AG

    IPC分类号: G02B3/00 G01J1/42 G01J1/04

    摘要: In a method of manufacturing an optical system that comprises at least one beam deflection unit, at least one diaphragm element, and at least one holder for fixing the beam deflection element and the diaphragm element in a predefined arrangement relative to one another, the beam deflection element and a screening element are provided. The beam deflection element and the screening element are fixed by means of the holder such that the actual arrangement of the screening element relative to the beam deflection element corresponds to the predefined arrangement of the diaphragm element relative to the beam deflection element. The beam deflection element is irradiated by the processing light beams such that after a deflection by the beam deflection element the processing light beams are incident on a functional zone of the screening element and change its optical properties by energy emission.