公开(公告)号：US20220082724A1

公开(公告)日：2022-03-17

申请号：US17415940

申请日：2018-12-20

申请人： SICK AG ,  TRUMPF Werkzeugmaschinen GmbH + Co. KG

发明人： Jens OTTNAD ,  Dennis WOLF ,  Kevin LUTZ ,  Christoph BLÖMKER ,  Michael BURGER ,  Peter STEURER ,  Günter HIRT ,  Stefan KIENZLER

IPC分类号： G01V8/20 ,  B23Q15/007

摘要： A sensor apparatus for detecting a target object influenced by a process or formed in the process includes a sensor unit and an evaluation device. The sensor unit detects the target object in a detection zone of the sensor unit and generates a sensor signal that can be influenced by the target object. The evaluation device processes the sensor signal as a first input variable and generates an output signal, which indicates the detection of the target object, in dependence on the sensor signal. The evaluation device further processes a process parameter of the process, which acts on the target object, or a target object parameter, which characterizes the target object and is influenced by the process, as a respective further input variable and to generate the output signal in dependence on the process parameter and/or the target object parameter.