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公开(公告)号：US20220291169A1
公开(公告)日：2022-09-15
申请号：US17690305
申请日：2022-03-09
Applicant: SINTOKOGIO, LTD.
Inventor： Yoshiyasu MAKINO , Kan AOKI , Shuji HAYASHIDA
Abstract: A management device includes: an acquisition unit that acquires inspection result data indicating an inspection result of each of a plurality of workpieces and processing condition data indicating a processing condition used for processing each of the plurality of workpieces; an analysis unit that selects a specific parameter correlated with the inspection result among a plurality of processing parameters; and a prediction unit that predicts predict whether or not the processing device will become abnormal in future based on a temporal change in a value of the specific parameter.
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