公开(公告)号：US20200234419A1

公开(公告)日：2020-07-23

申请号：US16486907

申请日：2018-05-10

Applicant: SINTOKOGIO, LTD.

Inventor： Kazuhiro OTA ,  Tsutomu SEKI ,  Yoshimitsu ICHINO ,  Junichi IWASAKI ,  Takeshi SONOHARA ,  Ryuichi KAWAKAMI ,  Tatsuya AOKI

IPC: G06T7/00 ,  G06K9/20 ,  G01N21/90 ,  B22C19/04 ,  B22D37/00

Abstract: An inspection device is a device that inspects the appearance of a target, including: an imaging device configured to image the target from a first direction; an illuminating unit configured to apply light to the target; and a controller configured to acquire a first inspection image by causing the imaging device to image the target to which light is applied from a first position, to acquire a second inspection image by causing the imaging device to image the target to which light is applied from a second position, and to inspect an appearance of the target based on the first inspection image, the second inspection image, and a reference image. The first position and the second position overlap each other when viewed from the first direction.