公开(公告)号：US20230140765A1

公开(公告)日：2023-05-04

申请号：US17967089

申请日：2022-10-17

Applicant: STMICROELECTRONICS S.r.l.

Inventor： Leonardo PEDONE ,  Simone SCADUTO ,  Rossella GAUDIANO ,  Matteo BRIVIO ,  Matteo VENTURELLI

IPC: G01R31/317 ,  H03M1/78 ,  H03M1/74

Abstract: A digital-to-analog converter (DAC) includes a switching network and built-in-self-test (BIST) circuitry. The DAC, in operation, generates analog output signals in response to input codes of a set of input codes of the DAC. The BIST circuitry sequentially applies codes of a determined subset of codes of the set of input codes to test the plurality of switches. The determined subset of codes has fewer codes than the set of input codes. The BIST circuitry detects failures of switches of the plurality of switches based on responses of the DAC to the applied codes. In response to detecting a failure of a switch, the BIST generates a signal indicating a failure of the switching network.