公开(公告)号：US20040263267A1

公开(公告)日：2004-12-30

申请号：US10603239

申请日：2003-06-24

Applicant: STMicroelectronics, Inc.

Inventor： Rong Yin ,  Thomas Allyn Coker

IPC: H03B001/00

CPC classification number: G01R23/15

Abstract: A method and circuit are disclosed for detecting the performance of an oscillator circuit. In particular, the circuit may detect a signal, such as the output of the oscillator circuit, failing to oscillate as desired. The second circuit may be capable of detecting whether the signal oscillates at a frequency that is less than a predetermined frequency. The second circuit may include timing circuits for determining whether the signal remains in a first logic state for at least a predetermined period of time and whether the signal remains in a second logic state for at least the predetermined period of time.

Abstract translation: 公开了一种用于检测振荡器电路的性能的方法和电路。 特别地，电路可以检测诸如振荡器电路的输出的信号，如期望的那样不能振荡。 第二电路可能能够检测信号是否以小于预定频率的频率振荡。 第二电路可以包括用于确定信号是否保持在第一逻辑状态至少预定时间段的定时电路，以及该信号是否在至少预定时间段内保持在第二逻辑状态。