公开(公告)号：US20250102593A1

公开(公告)日：2025-03-27

申请号：US18472684

申请日：2023-09-22

Applicant: STMicroelectronics International N.V.

Inventor： Francesco Rundo ,  Michele Calabretta ,  Marco Maria Branciforte ,  Concetto Spampinato ,  Salvatore Coffa

IPC: G01R31/40 ,  G06N3/084

Abstract: A method of characterizing a parameter (e.g., threshold voltage) of a power electronic device using an artificial intelligence (AI) model includes sampling measured parameter values (e.g., voltage, current) of the power electronic device during operation and characterizing the parameter of the power electronic device using the AI model in inference mode with the measured parameter values as inputs. The AI model is trained using a joint loss function including a Jacobian regularization term. The Jacobian regularization term may depend on the norm of at least one Jacobian of a corresponding set of training inputs. A power electronics system configured to perform the method includes the power electronic device and a computing system with a processor and memory storing the AI model. The computing system may be a microcontroller. The system may also include an analog-to-digital converter (ADC) circuit, such as in the microcontroller.