公开(公告)号：US20250004067A1

公开(公告)日：2025-01-02

申请号：US18677834

申请日：2024-05-29

Applicant: STMicroelectronics International N.V.

Inventor： Philippe Bienvenu ,  Antonio Calandra ,  Julia Castellan

IPC: G01R31/40

Abstract: The present disclosure relates to a device for measuring a power current supplied by a main power FET. The device includes a current measurement power FET coupled with the main FET; first and second FETs, the gates of which are coupled with each other, the first FET is coupled with the current measurement FET, in which a source/drain terminal of the second FET is coupled with a source/drain terminal of the first FET, or a source/drain terminal of the second FET is coupled with a source/drain terminal of the main FET or to a voltage source or load external to the device, and source/drain terminals of the first and second FETs are coupled with each other.