公开(公告)号：US20240402278A1

公开(公告)日：2024-12-05

申请号：US18677437

申请日：2024-05-29

Applicant: STMicroelectronics International N.V.

Inventor： Ravinder Kumar KUMAR ,  Saiyid Mohammad Irshad RIZVI

IPC: G01R35/00 ,  G01R19/10 ,  G01R27/02

Abstract: A test circuit is configured to test and calibrate an impedance of a driver of an integrated circuit. Testing the impedance includes driving first and second currents through the driver via a first contact pad and a ground metallization of the integrated circuit. Testing the impedance includes measuring the voltage at a test metalization while driving the first and second current while the test metalization is successively coupled to the first contact pad and the ground metallization while driving the first and second test currents.