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公开(公告)号:US10595788B2
公开(公告)日:2020-03-24
申请号:US15169184
申请日:2016-05-31
Applicant: STMicroelectronics S.r.l.
Inventor: Beatrice Rossi , Pasqualina Fragneto , Daniele Zambon , Diego Carrera , Giacomo Boracchi
IPC: A61B5/00 , A61B5/0472 , A61B5/0452 , A61B5/0468 , A61B5/11 , A61B5/024 , A61B5/0245 , A61B5/04 , A61B5/0402 , A61B5/0456
Abstract: A heartrate monitor detects heartbeats in a test signal. A local heartrate and an energy of acceleration are associated with the detected heartbeats. Detected heartbeats are included or excluded from a test set of heartbeats based on the local heartrate and energy of acceleration associated with the respective heartbeats. Anomalous heartbeats in the test set of heartbeats are detected using a sparse approximation model. The heartrate monitor may detect heartbeats in a training heartbeat signal. A reference heart rate and an energy of acceleration are associated with detected beats of the training heartbeat signal and selectively included in a set of training data based on the heart rate and energy of acceleration associated with the detected beat in the training heartbeat signal. A dictionary of the sparse representation model may be generated using the set of training data.
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公开(公告)号:US10922807B2
公开(公告)日:2021-02-16
申请号:US16174022
申请日:2018-10-29
Applicant: STMICROELECTRONICS S.r.l.
Inventor: Lidia Moioli , Pasqualina Fragneto , Beatrice Rossi , Diego Carrera , Giacomo Boracchi , Mauro Fumagalli , Elena Tagliabue , Paolo Giugni , Annalisa Aurigemma
IPC: G06T7/00
Abstract: A device includes image generation circuitry and a convolutional neural network. The image generation circuitry, in operation, generates a binned representation of a wafer defect map (WDM). The convolutional-neural-network, in operation, generates and outputs an indication of a root cause of a defect associated with the WDM based on the binned representation of the WDM and a data-driven model associating WDMs with classes of a defined set of classes of wafer defects.
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