公开(公告)号：US20170343339A1

公开(公告)日：2017-11-30

申请号：US15602612

申请日：2017-05-23

申请人： Safran Vectronix AG

发明人： Ivo ANNEN ,  Silvio GNEPF

IPC分类号： G01B11/27 ,  G01V7/06 ,  G01C21/08

CPC分类号： G01B11/272 ,  G01C17/38 ,  G01C21/08 ,  G01V7/06

摘要： Disclosed is an optoelectronic measuring device having an electronic magnetic compass for determining an azimuthal alignment of the measuring device and a compensation unit, which is associated with the magnetic compass, for compensating for device-fixed interference fields, wherein the measuring device assumes at least two defined, repeatable operating states, has a different device-fixed interference field in each of the operating states, and the compensation unit carries out an initial compensation of the electronic magnetic compass in a first operating state of the measuring device, wherein the compensation unit has a detection unit for detecting a present operating state, a memory unit for storing a magnetic offset resulting from the different device-fixed interference fields between the first and a second operating state of the measuring device, and a computer unit for computing the azimuthal alignment of the measuring device depending on an ascertained operating state and based on the magnetic offset.