公开(公告)号：US20230280606A1

公开(公告)日：2023-09-07

申请号：US18115962

申请日：2023-03-01

Applicant: Samsung Display Co., LTD.

Inventor： Kwang Taek HONG ,  Jun Yeong PARK ,  Hwa Sung WOO

IPC: G02F1/13 ,  G01N21/95

CPC classification number: G02F1/1309 ,  G01N21/95 ,  G01N2021/9513

Abstract: A method of inspecting a display substrate including pixel patterns provided in pixel areas disposed in a display area in a first direction and a second direction may include obtaining a captured image of the pixel patterns of the display substrate, grouping pixels included in the captured image by grouping at least two pixels disposed in the first direction into a pixel group, designating each pixel group included in the captured image as a target pixel group, comparing pixel patterns of the target pixel group with pixel patterns of an adjacent pixel group positioned in a third direction with respect to the target pixel group, and determining whether the pixel patterns of the target pixel group are defective.