公开(公告)号：US20250131862A1

公开(公告)日：2025-04-24

申请号：US18917365

申请日：2024-10-16

Applicant: Samsung Display Co., LTD.

Inventor： Young Min PARK ,  Young Keun LEE ,  A Ree SONG ,  Jung A CHOI ,  Hye Young HA

IPC: G09G3/00 ,  G09G3/3208

Abstract: According to one or more embodiments, a method of inspecting a display device may include measuring first luminance of each of first pixels included in a first group and measuring first correction luminance of a correction pixel while the first group and the correction pixel are turned on, measuring second luminance of each of second pixels included in a second group and measuring second correction luminance of the correction pixel while the second group and the correction pixel are turned on, measuring third luminance of each of third pixels included in a third group and measuring third correction luminance of the correction pixel while the third group and the correction pixel are turned on, measuring fourth luminance of each of fourth pixels included in a fourth group and measuring fourth correction luminance of the correction pixel while the fourth group and the correction pixel are turned on.