公开(公告)号：US20250072179A1

公开(公告)日：2025-02-27

申请号：US18627247

申请日：2024-04-04

Applicant: Samsung Display Co., LTD.

Inventor： YONG JUN PARK ,  YOUNG SUK LEE

IPC: H01L33/58 ,  H01L25/075

Abstract: A display device includes: a light emitting element layer including at least one light emitting device to emit light; a light transmitting film on the light emitting element layer, the light transmitting film having a first refractive index, and defining openings; a light blocking pattern on the light emitting element layer and in the openings; and a low refractive film on the light transmitting film, the low refractive film having a second refractive index smaller than the first refractive index, and including refractors inclined to have an inclination angle with respect to an imaginary line perpendicular to an upper surface of the light transmitting film.

公开(公告)号：US20250040352A1

公开(公告)日：2025-01-30

申请号：US18637289

申请日：2024-04-16

Applicant: Samsung Display Co., Ltd.

Inventor： YOUNG SUK LEE ,  YONG JUN PARK

IPC: H10K59/122 ,  H10K59/12 ,  H10K59/35 ,  H10K59/80 ,  H10K59/88

Abstract: Disclosed is a display panel including a barrier wall defining a barrier wall opening and an inspection opening, and including a first barrier wall layer, and a second barrier wall layer above the first barrier wall layer, and an inspection pattern in the inspection opening, and including a same material as the first barrier wall layer, wherein the barrier wall opening includes a first region defined by an inner surface of the first barrier wall layer, and a second region defined by an inner surface of the second barrier wall layer, and having a smaller width than a width of the first region.

公开(公告)号：US20240369349A1

公开(公告)日：2024-11-07

申请号：US18417988

申请日：2024-01-19

Applicant: SAMSUNG DISPLAY CO., LTD.

Inventor： JONGHWAN LEE ,  YONG JUN PARK

IPC: G01B11/06

Abstract: A thickness measuring device includes: a light source circuit including: a light source which irradiates light to a surface of a substrate including a plurality of thin films and a lens which magnifies light emitted from the light source or reflected from the surface of the substrate, a detector circuit including a spectrometer which measures a reflectance for each wavelength of light reflected from the surface of the substrate and passed through the lens to generate reflectance values and which derives reflectance spectrum data for each wavelength from the reflectance values, and a control circuit which converts the reflectance spectrum data for each wavelength into a digital signal and calculates a thickness of at least one thin film among the plurality of thin films by performing fast Fourier transform on the digital signal.

公开(公告)号：US20140153002A1

公开(公告)日：2014-06-05

申请号：US13834858

申请日：2013-03-15

Applicant: SAMSUNG DISPLAY CO., LTD.

Inventor： YONG JUN PARK ,  HYUNGJUN KIM ,  YOUNG SUK LEE ,  JONGSOO LEE

IPC: G01N21/95 ,  H01L23/544

CPC classification number: G09G3/006 ,  G03F7/70625

Abstract: A display panel includes a plurality of pixel areas and at least one inspection area. An incident light is irradiated onto an inspection pattern disposed in the inspection area and a reflection light reflected by the inspection pattern is detected. An optical critical dimension of the inspection pattern is calculated from the reflection light, and a dimension of a pixel pattern disposed in each pixel area is calculated from the optical critical dimension of the inspection pattern. Accordingly, the dimension of the pixel pattern may be indirectly measured from the inspection pattern.

Abstract translation: 显示面板包括多个像素区域和至少一个检查区域。 将入射光照射到设置在检查区域中的检查图案，并检测由检查图案反射的反射光。 根据反射光计算检查图案的光临界尺寸，并且从检查图案的光临界尺寸计算设置在每个像素区域中的像素图案的尺寸。 因此，可以从检查图案间接测量像素图案的尺寸。