公开(公告)号：US12277694B2

公开(公告)日：2025-04-15

申请号：US17325396

申请日：2021-05-20

Applicant: Samsung Display Co., Ltd.

Inventor： Younggil Park ,  Kihyun Kim ,  Younguook Lee

IPC: G06T7/00 ,  G06N3/04 ,  G06N3/08 ,  G06T7/70

Abstract: A method of detecting a defect in a stacked structure of a display panel includes collecting a first image of the defect and a plurality of layers in the stacked structure from a database, learning a defect information of the defect and a layer information of the layers using a deep learning model based on the first image and detecting a location of the defect among the layers by the defect information and the layer information.