公开(公告)号：US20250166266A1

公开(公告)日：2025-05-22

申请号：US18949390

申请日：2024-11-15

Applicant: Samsung Display Co., Ltd.

Inventor： Zhihong Pan ,  Rahul Shenoy ,  Kaushik Balakrishnan ,  Qisen Cheng ,  Janghwan Lee

IPC: G06T11/60 ,  G06T5/60 ,  G06T5/70 ,  G06T7/00

Abstract: A system and a method are disclosed for defect image generation using diffusion model sampling. The method includes generating, by a processor via a diffusion model, a noisy image from a defect-free image, generating, by the processor via the diffusion model, a sampled defect image and a sampled defect-free image from the noisy image, generating, by the processor, a mask based on the sampled defect image and the sampled defect-free image, generating, by the processor, a synthetic defect image by generating an additional sampled defect image based on the noisy image and the mask, and transmitting, by the processor, the synthetic defect image.