-
公开(公告)号：US20210263794A1
公开(公告)日：2021-08-26
申请号：US17318643
申请日：2021-05-12
Applicant: Samsung Electronics Co., Ltd.
Inventor： Beom-kyu SHIN , Sung-kyu PARK
Abstract: Provided are a memory controller with improved data reliability, a memory system including the memory controller, and a method of operating the memory controller. The memory controller includes an error correction code (ECC) circuit configured to perform an error detection on a codeword read from a memory device; and a processor configured to set at least one memory chip from among a plurality of memory chips as an indicator chip, monitor an error occurrence in the indicator chip based on a result of the error detection, and output reliability deterioration information indicating that the reliability of the memory device is deteriorated based on a result of the monitoring.
-
公开(公告)号：US20200151054A1
公开(公告)日：2020-05-14
申请号：US16407881
申请日：2019-05-09
Applicant: Samsung Electronics Co., Ltd.
Inventor： Beom-kyu SHIN , Sung-kyu PARK
Abstract: Provided are a memory controller with improved data reliability, a memory system including the memory controller, and a method of operating the memory controller. The memory controller includes an error correction code (ECC) circuit configured to perform an error detection on a codeword read from a memory device; and a processor configured to set at least one memory chip from among a plurality of memory chips as an indicator chip, monitor an error occurrence in the indicator chip based on a result of the error detection, and output reliability deterioration information indicating that the reliability of the memory device is deteriorated based on a result of the monitoring.
-
Search Results
2
records
(took 0.012 seconds)
