公开(公告)号：US20250157065A1

公开(公告)日：2025-05-15

申请号：US18661638

申请日：2024-05-12

Applicant: Samsung Electronics Co., Ltd.

Inventor： Yong Hee LEE ,  Jae Hong CHO ,  Sun Ho KIM ,  Bong Ki PARK ,  Byung Chul SONG

IPC: G06T7/521 ,  A46B9/02 ,  A46B13/00 ,  A46B13/02 ,  B08B1/12 ,  B08B1/34 ,  B08B13/00

Abstract: Provided is an apparatus for measuring a brush that measures shapes of nodules included in the brush and manages specifications of the nodules. The apparatus includes a rotating unit configured to rotate the brush, a sensor unit spaced apart from the brush in a second direction intersecting the first direction, a horizontal drive unit configured to move the sensor unit in the first direction; and a controller configured to control at least one of the sensor unit, the rotating unit, and the horizontal drive unit. The brush includes a first row including nodules spaced apart from each other in the first direction. The controller is configured to control the sensor unit and the horizontal drive unit such that while the horizontal drive unit moves the sensor unit in the first direction, the sensor unit performs first measurement of a shape of each of the nodules included in the first row.