公开(公告)号：US09915681B2

公开(公告)日：2018-03-13

申请号：US14955545

申请日：2015-12-01

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sunghoon Jang ,  Minsuk Choi ,  Byungho Choi ,  Taehwan Kim

IPC: G01R1/067

CPC classification number: G01R1/06722

Abstract: A semiconductor test apparatus includes a pogo pin that is provided on a board and is in contact with an inspected object. The pogo pin includes a barrel fixedly disposed on the board, a plunger movably coupled to the barrel, and a conduction film covering the pogo pin. The conduction film contacts a portion of the plunger to be electrically connected to the plunger while being electrically insulated from the barrel.