IMAGE SENSOR AND METHOD FOR FABRICATING THE SAME

    公开(公告)号:US20230197742A1

    公开(公告)日:2023-06-22

    申请号:US18061628

    申请日:2022-12-05

    CPC classification number: H01L27/14616 H01L27/14645

    Abstract: An image sensor includes a first semiconductor substrate, a photoelectric conversion region in the first semiconductor substrate, and a buried insulating film on the first semiconductor substrate. The buried insulating film covers a first region of the first semiconductor substrate and exposes a second region of the first semiconductor substrate. The sensor includes a second semiconductor substrate on the buried insulating film, an operating gate structure defining a first channel of a first conductive type in the second semiconductor substrate, and a transfer gate structure defining a second channel of a second conductive type different from the first conductive type in the second region of the first semiconductor substrate.

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