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公开(公告)号:US20230254474A1
公开(公告)日:2023-08-10
申请号:US18162943
申请日:2023-02-01
Applicant: Samsung Electronics Co., Ltd.
Inventor: Eunseung Yun , Gyeonghan Cha , Jaehyuck Kang , Daechul Kwon
IPC: H04N17/00
CPC classification number: H04N17/002
Abstract: An image sensor includes a test image generator configured to receive pixel data of a group of pixels including channel that corresponds to a size of a plurality of row regions of a pixel array that includes the plurality of row regions and a plurality of column regions, and is configured to generate test image data based on the pixel data, and an interface configured to transmit the test image data from the test image generator to a test device. The test image generator is configured to divide the pixel data into a first column region corresponding to 2n-th column region of the column regions of the pixel data and a second column region corresponding to 2n−1-th column region of the column regions of the pixel data and configured to generate a test image based on the first column region.
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公开(公告)号:US12207007B2
公开(公告)日:2025-01-21
申请号:US18162943
申请日:2023-02-01
Applicant: Samsung Electronics Co., Ltd.
Inventor: Eunseung Yun , Gyeonghan Cha , Jaehyuck Kang , Daechul Kwon
Abstract: An image sensor includes a test image generator configured to receive pixel data of a group of pixels including channel that corresponds to a size of a plurality of row regions of a pixel array that includes the plurality of row regions and a plurality of column regions, and is configured to generate test image data based on the pixel data, and an interface configured to transmit the test image data from the test image generator to a test device. The test image generator is configured to divide the pixel data into a first column region corresponding to 2n-th column region of the column regions of the pixel data and a second column region corresponding to 2n−1-th column region of the column regions of the pixel data and configured to generate a test image based on the first column region.
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