METHODS OF CALIBRATING X-RAY DETECTORS
    1.
    发明申请
    METHODS OF CALIBRATING X-RAY DETECTORS 有权
    校准X射线探测器的方法

    公开(公告)号:US20140119517A1

    公开(公告)日:2014-05-01

    申请号:US13904600

    申请日:2013-05-29

    CPC classification number: G01T7/005

    Abstract: A method of calibrating a first threshold voltage that is a reference of X-ray detection for each unit cell of a plurality of unit cells of an X-ray detector may comprise detecting an X-ray by using a plurality of second threshold voltages for each of a plurality of X-rays having spectra at different energy levels; determining a correspondence relationship between energies having a maximum intensity in the spectra of X-rays and third threshold voltages at which a maximum number of photons having a same energy intensity are detected; and/or calibrating the first threshold voltage based on the determined correspondence relationship.

    Abstract translation: 校准作为X射线检测器的多个单位单元的每个单位单元的X射线检测的参考的第一阈值电压的方法可以包括通过使用多个第二阈值电压来检测X射线 具有不同能级的光谱的多个X射线; 确定在X射线的光谱中具有最大强度的能量与检测到具有相同能量强度的最大光子数的第三阈值电压之间的对应关系; 和/或基于确定的对应关系来校准第一阈值电压。

Patent Agency Ranking