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公开(公告)号:US20180157155A1
公开(公告)日:2018-06-07
申请号:US15579375
申请日:2016-02-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sergii GRYSHCHENKO , Iegor VDOVYCHENKO , Ivan SAFONOV , Andrii BUT , Vitaliy BULYGIN , Volodymyr KHRISTYAN
CPC classification number: G03B21/008 , G01S7/4815 , G01S17/42 , G01S17/48 , G01S17/89 , G03B21/2033 , G03B21/28 , G06K9/00355
Abstract: An optical device is disclosed. An optical device of the present invention that generates a depth map for an object comprises: a projector for irradiating electromagnetic waves onto an object; an optical receiver for receiving reflected waves reflected from the object; and a processor for generating a first depth map for the object on the basis of the direction of arrival of the received reflected waves, generating a second depth map for the object on the basis of the arrival time of the received reflected waves, and combining the first depth map and the second depth map and generating a depth map for the object.
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公开(公告)号:US20200234458A1
公开(公告)日:2020-07-23
申请号:US16743736
申请日:2020-01-15
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kostiantyn MOROZOV , Dmytro VAVDIIUK , Oleksandr KLIMENKOV , Andrii SUKHARIEV , Ivan SAFONOV
Abstract: An apparatus and method for measuring a depth in a structured depth camera system including a projector and a camera for receiving light radiated by a source pattern from the projector and reflected from one or more objects in a scene is provided. The apparatus includes an interface unit configured to receive an electrical signal based on light received from the camera; and at least one processor configured to obtain depth information of the scene based on the electrical signal received from the interface unit, wherein the at least one processor is configured to identify a recognition pattern corresponding to the light received by the camera based on the electrical signal, to obtain a total distance value between properties of a partial source pattern corresponding to a target fragment in the source pattern and properties of a partial recognition pattern corresponding to the target fragment in the recognition pattern, and to estimate depth information of the target fragment based on the obtained total distance value.
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公开(公告)号:US20210327079A1
公开(公告)日:2021-10-21
申请号:US17269225
申请日:2019-07-01
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kostiantyn MOROZOV , Dmytro KORBA , Ruslan LERMOLENKO , Andrii SUKHARIEV , Serhii ILIUKHIN , Andrii BUT , Ivan SAFONOV , Yaroslav LAVRENYUK , Oleksandr KLIMENKOV , Dmytro VAVDIIUK
Abstract: A synchronization method of a first depth sensing apparatus includes: transmitting a first optical signal to measure a distance to an object; receiving the first optical signal reflected by the object; when recognition of the received first optical signal fails, stopping transmission of the first optical signal and generating first synchronization information for synchronization with at least one second depth sensing apparatus; receiving a third optical signal for synchronization with the first depth sensing apparatus, which is transmitted by the at least one second depth sensing apparatus, and decoding the received third optical signal to extract at least one piece of second synchronization information; determining a time point at which and a cycle in which to re-transmit the first optical signal, based on the first synchronization information and the at least one piece of second synchronization information; and re-transmitting the first optical signal at the determined time point and cycle.
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公开(公告)号:US20220011096A1
公开(公告)日:2022-01-13
申请号:US17309033
申请日:2019-10-28
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kostiantyn MOROZOV , Oleksandr KLIMENKOV , Dmytro VAVDIIUK , Ivan SAFONOV , Andrii BUT , Andrii SUKHARIEV , Ruslan IERMOLENKO , Serhii ILIUKHIN , Yaroslav LAVRENYUK
Abstract: A three-dimensional depth measuring method using a structured light camera comprising a first projector, a second projector, and an optical sensor, according to the present disclosure, comprises: a step in which a first light pattern is projected by the first projector; a step in which a second light pattern is projected by the second projector; a step of filtering, by a color filter, a third light pattern in which the first light pattern and the second light pattern reflected from an object overlap, so as to separate the third light pattern into a first filtered pattern and a second filtered pattern; a step of localizing the first filtered pattern and classifying first feature points of the first filtered pattern; a step of localizing the second filtered pattern and classifying second feature points of the second filtered pattern; and a step of obtaining position information of the object on the basis of the first feature points and the second feature points.
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公开(公告)号:US20180302259A1
公开(公告)日:2018-10-18
申请号:US15766986
申请日:2016-10-17
Applicant: Samsung Electronics Co., Ltd.
Inventor: Iegor VDOVYCHENKO , Andrii BUT , Illia FEDORIN , Ivan SAFONOV , Sergii GRYSHCHENKO , Vitaliy BULYGIN
Abstract: The present invention relates to an apparatus for obtaining a signal, which may comprise an electronic apparatus comprising: an antenna for receiving a signal via at least one channel from an external apparatus; a reference signal generation unit for generating a reference signal on the basis of frequency-related values and transmitting the reference signal to a signal correlation unit; a signal correlation unit for calculating a correlation value between the signal and the reference signal; a correlation maximum signal identifying unit for identifying a time value corresponding to a correlation value exceeding a preset reference value from among correlation values calculated from the signal correlation unit and delivering the identified time value to a least square calculation unit; and a least square calculation unit for calculating at least any one of a magnitude value and a phase value of a frequency on the basis of the identified time value and delivering the calculated value to the reference signal generation unit. However, the present invention is not limited to the above-described embodiment, but may include other embodiments.
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