公开(公告)号：US12112514B2

公开(公告)日：2024-10-08

申请号：US17361556

申请日：2021-06-29

Applicant: Samsung Electronics Co., Ltd.

Inventor： Junik Jang ,  Jaeil Jung ,  Jonghee Hong

IPC: G06V10/40 ,  G06F18/214 ,  G06N3/045 ,  G06N3/08 ,  G06T9/00 ,  G06V10/75 ,  G06V10/774 ,  G06V10/82

CPC classification number: G06V10/40 ,  G06F18/214 ,  G06N3/045 ,  G06N3/08 ,  G06T9/002 ,  G06V10/75 ,  G06V10/774 ,  G06V10/82

Abstract: According to certain embodiments, an electronic apparatus comprises: a memory storing a generator previously trained to generate a prediction image based on one or more input images; and a processor configured to: acquire feature data from a plurality of image frames input through at least one layer included in the generator, extract feature data corresponding to change over time from the feature data acquired through an attention layer included in the generator, and acquire a prediction image frame by inputting the extracted feature data to at least one other layer included in the generator.

公开(公告)号：US11553178B2

公开(公告)日：2023-01-10

申请号：US17026020

申请日：2020-09-18

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jaeil Jung ,  Junik Jang ,  Jonghee Hong

IPC: H04N19/176 ,  H04N19/117 ,  H04N19/182 ,  G06T9/00

Abstract: A method for analyzing an image for anomaly detection includes obtaining a first image. The method also includes generating a second image by auto-encoding the first image. The method additionally includes extracting first and second feature vectors from the first and second images, respectively. The method further includes filtering each of the first and second feature vectors by using a filtering vector generated based on first distance values between first respective elements of the first and second feature vectors. Additionally, the method includes determining whether there is an anomaly in the first image based on second distance values between second respective elements of the filtered first and second feature vectors.