公开(公告)号：US10146507B2

公开(公告)日：2018-12-04

申请号：US15404826

申请日：2017-01-12

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Karpinskyy Bohdan ,  Yong-ki Lee ,  Mi-jung Noh ,  Sang-wook Park ,  Kitak Kim ,  Yong-Soo Kim ,  Yun-hyeok Choi

IPC: G06F7/58

Abstract: An apparatus for testing a random number generator includes a correlation test circuit and a randomness determination circuit. The correlation test circuit extracts a first plurality of bit pairs each including two bits spaced apart from each other by a first distance in a bit stream generated by the random number generator, obtains a first sum of differences between respective two bits of the first plurality of bit pairs, and obtains a second sum of differences between respective two bits of a second plurality of bit pairs, the second plurality of bit pairs each including two bits spaced apart from each other by a second distance, different from the first distance, in the bit stream. The randomness determination circuit determines a randomness of the bit stream, based on the first sum and the second sum.

公开(公告)号：US11303461B2

公开(公告)日：2022-04-12

申请号：US16677901

申请日：2019-11-08

Applicant: Samsung Electronics Co., Ltd.

Inventor： Ihor Vasyltsov ,  Karpinskyy Bohdan ,  Kalesnikau Aliaksei ,  Yun-Hyeok Choi

IPC: H04L9/32 ,  G06F21/73

Abstract: The inventive concept provides a security device capable of reducing an area of a die required for implementation of a stable PUF by increasing the value of entropy from a predefined number of entropy sources and/or minimizing a blind zone of a validity checking module. The security device uses an asynchronous configuration to minimize a blind zone. In various embodiments of the inventive concept, the blind zone is generated only in a period when a reset signal is at a first logic level. Therefore, it is possible to minimize the blind zone by minimizing a period in which the reset signal is at such logic level. A semiconductor device, semiconductor package, and/or smart card can be provided with such security device, as well as a method for determining a validity of a random signal using a semiconductor security device.

公开(公告)号：US10044513B2

公开(公告)日：2018-08-07

申请号：US14460982

申请日：2014-08-15

Applicant: Samsung Electronics Co., Ltd.

Inventor： Ihor Vasyltsov ,  Karpinskyy Bohdan ,  Kalesnikau Aliaksei ,  Yun-hyeok Choi

IPC: G06F21/64 ,  H04L9/32 ,  G06F21/73

Abstract: The inventive concept provides a security device capable of reducing an area of a die required for implementation of a stable PUF by increasing the value of entropy from a predefined number of entropy sources and/or minimizing a blind zone of a validity checking module. The security device uses an asynchronous configuration to minimize a blind zone. In various embodiments of the inventive concept, the blind zone is generated only in a period when a reset signal is at a first logic level. Therefore, it is possible to minimize the blind zone by minimizing a period in which the reset signal is at such logic level. A semiconductor device, semiconductor package, and/or smart card can be provided with such security device, as well as a method for determining a validity of a random signal using a semiconductor security device.