-
公开(公告)号:US20250054866A1
公开(公告)日:2025-02-13
申请号:US18796804
申请日:2024-08-07
Applicant: Samsung Electronics Co., Ltd.
Inventor: Keun Wook SHIN , Sangwon KIM , Chang Seok LEE , Joonseok KIM , Joonyun KIM , Giyoung JO , Luhing HU
IPC: H01L23/532 , H01L23/528
Abstract: Disclosed are an interconnect structure including a substrate, a metal layer on the substrate, and a passivation layer including a topological compound and in contact with the metal layer.