公开(公告)号：US20240242492A1

公开(公告)日：2024-07-18

申请号：US18407957

申请日：2024-01-09

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sangkyu PARK ,  Keunseo KIM

IPC: G06V10/82 ,  G06V10/77 ,  G06V10/771 ,  G06V10/776

CPC classification number: G06V10/82 ,  G06V10/771 ,  G06V10/7715 ,  G06V10/776

Abstract: A method and electronic device are provided herein. A processor-implemented method may include training a neural network through representation learning using, as training data, a plurality of signal images, a respective metadata mapped to each of the plurality of signal images, and a respective temporary classified label of each of the plurality of signal images, extracting latent features for each of the plurality of signal images using the trained neural network, and generating a feature map representing the plurality of signal images based on respective differences between the extracted latent features, and correcting label information, for a signal image and for a corresponding temporary classification label in the respective temporary classified labels, to have corrected classification information, including determining that the corresponding temporary classification label of the signal image is mislabeled using the generated feature map.

公开(公告)号：US20250086079A1

公开(公告)日：2025-03-13

申请号：US18828022

申请日：2024-09-09

Applicant: Samsung Electronics Co., Ltd.

Inventor： Keunseo KIM ,  Jaecheol LEE ,  Sangkyu PARK ,  Sangdo PARK ,  Dokyoung KIM ,  Minkyu YANG ,  Young LEE ,  Jinsic JANG

IPC: G06F11/22

Abstract: A method for verifying reliability of a test for products performed by test equipment includes: receiving result images generated from preprocessing of result data of the test, the result data of the test including labels for a plurality of scale levels and the received result images including first result images belonging to a first scale level of the plurality of scale levels and second result images belonging to a second scale level of the plurality of scale levels; making a first determination, from the first result images, whether the first scale level is normal or abnormal; making a second determination, from the second result images, whether the second scale level is normal or abnormal; and determining that no error occurred in the test in response to both the first scale level and the second scale level being determined to be normal; or determining that an error occurred in the test in response to at least one scale level being determined to be abnormal.

公开(公告)号：US20240201673A1

公开(公告)日：2024-06-20

申请号：US18330589

申请日：2023-06-07

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Keunseo KIM ,  Gyungmin KIM ,  Sangdo PARK

IPC: G05B19/418 ,  G06T7/00 ,  H01L21/66

CPC classification number: G05B19/41875 ,  G06T7/001 ,  H01L22/12 ,  G05B2219/2602 ,  G06T2207/20081 ,  G06T2207/20084

Abstract: A processor-implemented method of an apparatus or system includes obtaining an expert classification criterion from a memory of the apparatus or system; converting manufacturing process data associated with a manufacturing process to a test sample in a form of an image; generating, using a machine learning model provided the test sample, a probability value that the test sample corresponds to a target class representing an anomaly occurring in the manufacturing process; adjusting the probability value by reflecting the expert classification criterion for the anomaly; and identifying, by classifying the anomaly based on the adjusted probability value, whether a final abnormality in the manufacturing process has occurred.