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    METHOD OF PROGRAMMING ONE-TIME PROGRAMMABLE (OTP) MEMORY DEVICE AND METHOD OF TESTING SEMICONDUCTOR INTEGRATED CIRCUIT INCLUDING THE SAME
    2.
    发明申请
    METHOD OF PROGRAMMING ONE-TIME PROGRAMMABLE (OTP) MEMORY DEVICE AND METHOD OF TESTING SEMICONDUCTOR INTEGRATED CIRCUIT INCLUDING THE SAME 有权
    编程一次性可编程（OTP）存储器件的方法和测试包括其中的半导体集成电路的方法

    公开(公告)号：US20170040067A1

    公开(公告)日：2017-02-09

    申请号：US15099902

    申请日：2016-04-15

    申请人： Samsung Electronics Co., Ltd.

    发明人： Do-Hoon Byun ,  Chang-Su Sim ,  Na-Rae Hong

    IPC分类号： G11C17/18 ,  G11C17/16

    CPC分类号： G11C17/18 ,  G11C17/16 ,  G11C29/027

    摘要： A method of testing a semiconductor integrated circuit including a one-time programmable (OTP) memory device is provided. A program command is transferred from a tester to the OTP memory device. Programming and a programming verification are performed with respect to OTP memory cells in the OTP memory device in response to the program command. The OTP device generates accumulated verification result signal by accumulating program verification results with respect to the OTP memory cells. The accumulated verification result signal is transferred from the OTP memory device to the tester.

    摘要翻译： 提供一种测试包括一次可编程（OTP）存储器件的半导体集成电路的方法。 程序命令从测试仪传输到OTP存储设备。 响应于程序命令，对OTP存储器件中的OTP存储器单元执行编程和编程验证。 OTP设备通过累积关于OTP存储器单元的程序验证结果来生成累积验证结果信号。 累积的验证结果信号从OTP存储设备传输到测试仪。