公开(公告)号：US20210264294A1

公开(公告)日：2021-08-26

申请号：US15931573

申请日：2020-05-13

Applicant: Samsung Electronics Co., Ltd.

Inventor： Qinling ZHENG ,  Nima ELYASI ,  Vikas SINHA ,  Changho CHOI

IPC: G06N5/04 ,  G06N20/00

Abstract: A method for predicting a time-to-failure of a target storage device may include training a machine learning scheme with a time-series dataset, and applying the telemetry data from the target storage device to the machine learning scheme which may output a time-window based time-to-failure prediction. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include applying a data quality improvement framework to a time-series dataset of operational and failure data from multiple storage devices, and training the scheme with the pre-processed dataset. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include training the scheme with a first portion of a time-series dataset of operational and failure data from multiple storage devices, testing the machine learning scheme with a second portion of the time-series dataset, and evaluating the machine learning scheme.

公开(公告)号：US20230281489A1

公开(公告)日：2023-09-07

申请号：US18197717

申请日：2023-05-15

Applicant: Samsung Electronics Co., Ltd.

Inventor： Qinling ZHENG ,  Nima ELYASI ,  Vikas SINHA ,  Changho CHOI

IPC: G06N5/04 ,  G06N20/00 ,  G06F11/16

CPC classification number: G06N5/04 ,  G06N20/00 ,  G06F11/16

Abstract: A method for predicting a time-to-failure of a target storage device may include training a machine learning scheme with a time-series dataset, and applying the telemetry data from the target storage device to the machine learning scheme which may output a time-window based time-to-failure prediction. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include applying a data quality improvement framework to a time-series dataset of operational and failure data from multiple storage devices, and training the scheme with the pre-processed dataset. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include training the scheme with a first portion of a time-series dataset of operational and failure data from multiple storage devices, testing the machine learning scheme with a second portion of the time-series dataset, and evaluating the machine learning scheme.