-
公开(公告)号：US20240144002A1
公开(公告)日：2024-05-02
申请号：US18355331
申请日：2023-07-19
Applicant: SanDisk Technologies LLC
Inventor： Chen-Che Huang , Lauren Matsumoto , Chunming Wang
IPC: G06N3/08
CPC classification number: G06N3/08
Abstract: A system that includes a machine learning model that is configured to receive an input layout file that includes a portion of an integrated circuit layout that has a previously identified wafer hotspot, match the previously identified wafer hotspot to one of a plurality of categories of wafer hotspot types, and output a proposed layout modification associated with the matching category of wafer hotspot types.
Search Results
1
records
(took 0.011 seconds)
筛选
AND
AND
过滤
NOT
NOT
Scan to Join
