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公开(公告)号：US20230091235A1
公开(公告)日：2023-03-23
申请号：US17908919
申请日：2021-03-10
申请人： Satoshi HAGIWARA , Junichi TAKAMI , Yu TESHIMA , Tomoki UMEZAWA , Gakushi MIYARA
发明人： Satoshi HAGIWARA , Junichi TAKAMI , Yu TESHIMA , Tomoki UMEZAWA , Gakushi MIYARA
IPC分类号： G05B19/418
摘要： An information processing apparatus includes a detection result acquisition unit to acquire, for each of processes performed on a plurality of workpieces, a detection result of a physical quantity that changes according to processing applied to a workpiece; an identification information acquisition unit to acquire process identification information identifying one of the processes performed on the same workpiece and workpiece identification information identifying one of the workpieces subjected to the same process; and a display control unit to display, on a display, the process identification information and the workpiece identification information; and display, on the display, abnormality likelihood information indicating likelihood of abnormality, determined based on the detection result, of the particular process or the particular workpiece, in association with at least one of the process identification information and the workpiece identification information.
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公开(公告)号：US20230008247A1
公开(公告)日：2023-01-12
申请号：US17847572
申请日：2022-06-23
摘要： A diagnostic system includes a tool to perform machining on a workpiece, a test piece to be subjected to test machining by the tool for abnormal detection, a sensor to generate sensor data representing a physical quantity generated in the test machining, and circuitry. The test piece is different from the workpiece. The circuitry controls the tool to perform the test machining in each cycle of machining on the workpiece and calculates a degree of abnormality from the sensor data of the test machining. The test machining is performed on the test piece under a test machining condition corresponding to a machining condition of the machining on the workpiece.
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