公开(公告)号：US09696455B2

公开(公告)日：2017-07-04

申请号：US14940048

申请日：2015-11-12

Applicant: Schlumberger Technology Corporation

Inventor： Richard J. Radtke ,  Christian Stoller ,  Michael D. Hackbart

IPC: G01V5/10 ,  G01V5/12

CPC classification number: G01V5/104

Abstract: The present disclosure describes a downhole tool that includes an electrically operated radiation generator that selectively outputs radiation to a surrounding environment based at least in part on supply of electrical power; a radiation detector that determines a first radiation metric based at least in part on first radiation measured when the electrically operated radiation generator is outputting radiation and that determines a second radiation metric based at least in part on second radiation measured when the electrically operated radiation generator is not outputting radiation; and a control system that determines whether the surrounding environment is properly shielded based at least in part on a relationship between the first radiation metric and the second radiation metric.

公开(公告)号：US20170139075A1

公开(公告)日：2017-05-18

申请号：US14940048

申请日：2015-11-12

Applicant: Schlumberger Technology Corporation

Inventor： Richard J. Radtke ,  Christian Stoller ,  Michael D. Hackbart

IPC: G01V5/10 ,  G01V5/12

CPC classification number: G01V5/104

Abstract: The present disclosure describes a downhole tool that includes an electrically operated radiation generator that selectively outputs radiation to a surrounding environment based at least in part on supply of electrical power; a radiation detector that determines a first radiation metric based at least in part on first radiation measured when the electrically operated radiation generator is outputting radiation and that determines a second radiation metric based at least in part on second radiation measured when the electrically operated radiation generator is not outputting radiation; and a control system that determines whether the surrounding environment is properly shielded based at least in part on a relationship between the first radiation metric and the second radiation metric.