LIDAR scan profile parameterization

    公开(公告)号:US11573299B2

    公开(公告)日:2023-02-07

    申请号:US16891415

    申请日:2020-06-03

    Inventor: Eric Dahlberg

    Abstract: A method includes detecting an object using a first light scan profile and, in response to detecting the object, using a second light scan profile with increased resolution in a region of interest relative to the first scan profile. The second light scan profile is based, at least in part, on a width of the region of interest, a number of scanlines for the region of interest, and an angular offset to the region of interest.

    LIDAR SCAN PROFILE PARAMETERIZATION

    公开(公告)号:US20210382149A1

    公开(公告)日:2021-12-09

    申请号:US16891415

    申请日:2020-06-03

    Inventor: Eric Dahlberg

    Abstract: A method includes detecting an object using a first light scan profile and, in response to detecting the object, using a second light scan profile with increased resolution in a region of interest relative to the first scan profile. The second light scan profile is based, at least in part, on a width of the region of interest, a number of scanlines for the region of interest, and an angular offset to the region of interest.

Patent Agency Ranking