Magneto optic kerr effect magnetometer for ultra-high anisotropy magnetic measurements
    1.
    发明授权
    Magneto optic kerr effect magnetometer for ultra-high anisotropy magnetic measurements 有权
    用于超高各向异性磁测量的磁光克尔效应磁力计

    公开(公告)号:US09348000B1

    公开(公告)日:2016-05-24

    申请号:US13836466

    申请日:2013-03-15

    CPC classification number: G01R33/0325

    Abstract: A resistive electromagnet assembly comprises a pair of coils with a gap defined between the coils. The resistive electromagnet assembly is configured to generate a field having a magnetic flux density of at least about 4 Tesla and at a sweep rate to complete a hysteresis loop in less than about 1 minute. A support assembly is configured to support a sample of magnetic material within the gap. An optics module is configured to expose a test region of the magnetic material sample to an optical beam probe while the test region is subjected to the field and to receive a reflected beam from the test region. A processor is coupled to the optics module and configured to measure one or more properties of the magnetic material using the received reflected beam.

    Abstract translation: 电阻式电磁铁组件包括一对在线圈之间具有间隙的线圈。 电阻电磁体组件被配置为产生具有至少约4特斯拉的磁通密度并且以扫描速率在小于约1分钟内完成磁滞回线的磁场。 支撑组件被配置成支撑间隙内的磁性材料样品。 光学模块被配置为当测试区域经受场并且接收来自测试区域的反射光束时,将磁性材料样品的测试区域暴露于光束探针。 处理器耦合到光学模块并被配置为使用所接收的反射光束来测量磁性材料的一个或多个特性。

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