公开(公告)号：US20220196571A1

公开(公告)日：2022-06-23

申请号：US17125754

申请日：2020-12-17

Applicant: Seagate Technology LLC

Inventor： Yen Eng FAM ,  Jun Lee KOK ,  Bak Leng LIM ,  Yen Ling LIM

IPC: G01N21/956 ,  G01N21/88 ,  G06T7/00

Abstract: A defect inspection system provides an image of a surface of a hard drive media to a machine learning model that is trained to identify predefined classifications of abnormal surface patterns on the hard drive media, each of the predefined classifications being associated in system memory with a severity indicator. The defect inspection model analyzes the image and generates and output indicating that the image includes a pattern consistent with a select classification of the predefined classifications of abnormal surface patterns. When the severity indicator for the select classification satisfies a failure condition, the defect inspection system automatically implements a corrective action.