公开(公告)号：US20170136396A1

公开(公告)日：2017-05-18

申请号：US15351094

申请日：2016-11-14

Applicant: Seagate Technology LLC

Inventor： Brian T. Dahl ,  Paul A. Beatty ,  Sumit Chandra ,  Jeffrey James Croxall

IPC: B01D46/00 ,  G11B33/14 ,  B01D46/44

CPC classification number: B01D46/0068 ,  B01D46/0086 ,  B01D46/442 ,  B01D46/444 ,  G11B33/146

Abstract: Aspects of the disclosure are directed to apparatuses and methods involving filters and detection of operation thereof. As may be consistent with one or more embodiments, an apparatus includes a fixture having mechanical components that hold a filter. Gas flow componentry operates with the fixture to eject particles from the filter by subjecting the filter to gas flow. A flow metering circuit meters the gas flow, and a particulate counter detects the ejected particles.

公开(公告)号：US10549228B2

公开(公告)日：2020-02-04

申请号：US15351094

申请日：2016-11-14

Applicant: Seagate Technology LLC

Inventor： Brian T. Dahl ,  Paul A. Beatty ,  Sumit Chandra ,  Jeffrey James Croxall

IPC: B01D46/00 ,  B01D46/44 ,  G11B33/14

Abstract: Aspects of the disclosure are directed to apparatuses and methods involving filters and detection of operation thereof. As may be consistent with one or more embodiments, an apparatus includes a fixture having mechanical components that hold a filter. Gas flow componentry operates with the fixture to eject particles from the filter by subjecting the filter to gas flow. A flow metering circuit meters the gas flow, and a particulate counter detects the ejected particles.

公开(公告)号：US10969308B2

公开(公告)日：2021-04-06

申请号：US15985020

申请日：2018-05-21

Applicant: Seagate Technology LLC

Inventor： Dennis Q. Cruz ,  Richard Nguyen ,  Jonathan P. Jones ,  Sumit Chandra

IPC: G01N1/24 ,  G01N1/22

Abstract: Aspects of the disclosure are directed to apparatuses and methods involving particulate sampling. As may be consistent with one or more embodiments, an apparatus includes a flow direction structure, a flow sampler and a particle collector having a collecting surface. The flow direction structure has interior sidewalls that direct the flow of particulate-laden gas along a flow path. The flow sampler is located in the flow path within the interior sidewalls, and operates with the flow direction structure to sample a portion of the particulate-laden gas at a reduced velocity, while allowing another portion of the particulate-laden gas to exhaust around the flow sampler. The flow sampler operates with the particle collector to direct the sampled portion of the particulate-laden gas to the collecting surface, and to adhere particulates from the particulate-laden gas to the collecting surface.

公开(公告)号：US20190353564A1

公开(公告)日：2019-11-21

申请号：US15985020

申请日：2018-05-21

Applicant: Seagate Technology LLC

Inventor： Dennis Q. Cruz ,  Richard Nguyen ,  Jonathan P. Jones ,  Sumit Chandra

IPC: G01N1/24 ,  G01N1/22

Abstract: Aspects of the disclosure are directed to apparatuses and methods involving particulate sampling. As may be consistent with one or more embodiments, an apparatus includes a flow direction structure, a flow sampler and a particle collector having a collecting surface. The flow direction structure has interior sidewalls that direct the flow of particulate-laden gas along a flow path. The flow sampler is located in the flow path within the interior sidewalls, and operates with the flow direction structure to sample a portion of the particulate-laden gas at a reduced velocity, while allowing another portion of the particulate-laden gas to exhaust around the flow sampler. The flow sampler operates with the particle collector to direct the sampled portion of the particulate-laden gas to the collecting surface, and to adhere particulates from the particulate-laden gas to the collecting surface.